Book description
Failure analysis is the preferred method to investigate product or
process reliability and to ensure optimum performance of electrical
components and systems. The physics-of-failure approach is the only
internationally accepted solution for continuously improving the
reliability of materials, devices and processes. The models have been
developed from the physical and chemical phenomena that are responsible
for degradation or failure of electronic components and materials and
now replace popular distribution models for failure mechanisms such as
Weibull or lognormal.
Reliability engineers need practical orientation around the complex
procedures involved in failure analysis. This guide acts as a tool for
all advanced techniques, their benefits and vital aspects of their use
in a reliability programme. Using twelve complex case studies, the
authors explain why failure analysis should be used with electronic
components, when implementation is appropriate and methods for its
successful use.
Inside you will find detailed coverage on:
- a synergistic approach to failure modes and mechanisms, along
with reliability physics and the failure analysis of materials,
emphasizing the vital importance of cooperation between a product
development team involved
- the reasons why failure analysis is an important tool for
improving yield and reliability by corrective actions
- the design stage, highlighting the 'concurrent engineering'
approach and DfR (Design for Reliability)
- failure analysis during fabrication, covering reliability
monitoring, process monitors and package reliability
- reliability resting after fabrication, including reliability
assessment at this stage and corrective actions
- a large variety of methods, such as electrical methods, thermal
methods, optical methods, electron microscopy, mechanical methods,
X-Ray methods, spectroscopic, acoustical, and laser methods
- new challenges in reliability testing, such as its use in
microsystems and nanostructures
This practical yet comprehensive reference is useful for
manufacturers and engineers involved in the design, fabrication and
testing of electronic components, devices, ICs and electronic systems,
as well as for users of components in complex systems wanting to
discover the roots of the reliability flaws for their products.
