Book description
X-ray fluorescence spectroscopy, one of the most powerful and flexible
techniques available for the analysis and characterization of materials
today, has gone through major changes during the past decade.
Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry,
Second Edition incorporates the latest industrial and scientific trends
in all areas. It updates all previous material and adds new chapters on
such topics as the history of X-ray fluorescence spectroscopy, the
design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.
Ron Jenkins draws on his extensive experience in training and consulting
industry professionals for this clear and concise treatment, covering
first the basic aspects of X rays, then the methodology of X-ray
fluorescence spectroscopy and available instrumentation. He offers a
comparison between wavelength and energy dispersive spectrometers as
well as step-by-step guidelines to X-ray spectrometric techniques for
qualitative and quantitative analysis-from specimen preparation to
real-world industrial application.
Favored by the American Chemical Society and the International Centre
for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is
an ideal introduction for newcomers to the field and an invaluable
reference for experienced spectroscopists-in chemical analysis, geology,
metallurgy, and materials science.
An up-to-date review of X-ray spectroscopic techniques. This proven
guidebook for industry professionals is thoroughly updated and expanded
to reflect advances in X-ray analysis over the last decade. X-Ray
Fluorescence Spectrometry, Second Edition includes:
* The history of X-ray fluorescence spectrometry-new to this edition.
* A critical review of the most useful X-ray spectrometers.
* Techniques and procedures for quantitative and qualitative analysis.
* Modern applications and industrial trends.
* X-ray spectra-new to this edition. RON JENKINS teaches at the
Inter-national Centre for Diffraction Data.
