Book description
Electrostatic discharge (ESD) continues to impact semiconductor
manufacturing, semiconductor components and systems, as technologies
scale from micro- to nano electronics. This book introduces the
fundamentals of ESD, electrical overstress (EOS), electromagnetic
interference (EMI), electromagnetic compatibility (EMC), and latchup,
as well as provides a coherent overview of the semiconductor
manufacturing environment and the final system assembly. It provides
an illuminating look into the integration of ESD protection networks
followed by examples in specific technologies, circuits, and chips.
The text is unique in covering semiconductor chip manufacturing
issues, ESD semiconductor chip design, and system problems confronted
today as well as the future of ESD phenomena and nano-technology.
Look inside for extensive coverage on:
- The fundamentals of electrostatics, triboelectric charging, and
how they relate to present day manufacturing environments of
micro-electronics to nano-technology
- Semiconductor manufacturing handling and auditing processing to
avoid ESD failures
- ESD, EOS, EMI, EMC, and latchup semiconductor component and system
level testing to demonstrate product resilience from human body
model (HBM), transmission line pulse (TLP), charged device model
(CDM), human metal model (HMM), cable discharge events (CDE), to
system level IEC 61000-4-2 tests
- ESD on-chip design and process manufacturing practices and
solutions to improve ESD semiconductor chip solutions, also
practical off-chip ESD protection and system level solutions to
provide more robust systems
- System level concerns in servers, laptops, disk drives, cell
phones, digital cameras, hand held devices, automobiles, and space applications
- Examples of ESD design for state-of-the-art technologies,
including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS
(HVCMOS), RF CMOS, smart power, magnetic recording technology,
micro-machines (MEMs) to nano-structures
ESD Basics: From Semiconductor Manufacturing to Product Use
complements the author's series of books on ESD protection. For those
new to the field, it is an essential reference and a useful insight
into the issues that confront modern technology as we enter the
Nano-electronic Era.
