Book description
This book enlightens readers on the basic surface properties and
distance-dependent intersurface forces one must understand to obtain
even simple data from an atomic force microscope (AFM). The material
becomes progressively more complex throughout the book, explaining
details of calibration, physical origin of artifacts, and signal/noise
limitations. Coverage spans imaging, materials property
characterization, in-liquid interfacial analysis, tribology, and
electromagnetic interactions.
“Supplementary material for this book can be found by entering ISBN
9780470638828 on booksupport. wiley. com”
GREG HAUGSTAD, PhD, is a technical staff member and Director of
the Characterization Facility in the College of Science and
Engineering at the University of Minnesota. He has collaborated with
industry professionals on such technologies as medical X-ray imaging
media, lubrication, inkjet printing, and more recently on biomedical
device coatings. He teaches undergraduate and graduate AFM courses, as
well as short professional courses, and has trained over 600 AFM users.
