Book description
A unique, design-based approach to reliability engineering
Design for Reliability provides engineers and managers with a
range of tools and techniques for incorporating reliability into the
design process for complex systems. It clearly explains how to design
for zero failure of critical system functions, leading to enormous
savings in product life-cycle costs and a dramatic improvement in the
ability to compete in global markets.
Readers will find a wealth of design practices not covered in typical
engineering books, allowing them to think outside the box when
developing reliability requirements. They will learn to address high
failure rates associated with systems that are not properly designed
for reliability, avoiding expensive and time-consuming engineering
changes, such as excessive testing, repairs, maintenance, inspection,
and logistics.
Special features of this book include:
- A unified approach that integrates ideas from computer science
and reliability engineering
- Techniques applicable to reliability as well as safety,
maintainability, system integration, and logistic engineering
- Chapters on design for extreme environments, developing reliable
software, design for trustworthiness, and HALT influence on design
Design for Reliability is a must-have guide for engineers and
managers in R&D, product development, reliability engineering,
product safety, and quality assurance, as well as anyone who needs to
deliver high product performance at a lower cost while minimizing
system failure.
DEV RAHEJA is President of Raheja Consulting, Inc. For over
thirty years, he has served clients in numerous industries, including
aerospace, medical devices, auto, and consumer products. Raheja is
also the coauthor of Assurance Technologies Principles and
Practices, Second Edition (Wiley).
LOUIS J. GULLO is Senior Principal Systems Engineer at Raytheon
Missile Systems in Tucson, Arizona. A retired U. S. Army Lieutenant
Colonel, Gullo has more than thirty years' experience in military,
space, and commercial programs. He is a Senior Member of the IEEE and
Chair of the IEEE Reliability Society Standards Committee.
