Book description
Written by one of the pioneers of 2D X-Ray Diffraction, this useful
guide covers the fundamentals, experimental methods and applications of
two-dimensional x-ray diffraction, including geometry convention, x-ray
source and optics, two-dimensional detectors, diffraction data
interpretation, and configurations for various applications, such as
phase identification, texture, stress, microstructure analysis,
crystallinity, thin film analysis and combinatorial screening.
Experimental examples in materials research, pharmaceuticals, and
forensics are also given. This presents a key resource to researchers in
materials science, chemistry, physics, and pharmaceuticals, as well as
graduate-level students in these areas.
Bob Baoping He
is the Director of R&D and Engineering at Bruker AXS (formerly
Siemens AXS). Mr. He holds a PhD in materials science from Virginia Tech
and holds twelve U. S. patents.
